This chapter describes one particular line of techniques
extensively and successfully used by the author and by many other
crystallographers. Adopting this method will enhance one's ability to
obtain high quality X-ray diffraction data from a single crystal and may
open new avenues of research in the direction of trapped
intermediates. It may well be that parts of the suggested method will
not be adequate for all users or cases but the techniques described here
can be used as a basis for variation and modifications.
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